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DDECS 2021 - April 7-9 2021
Vienna, Austria

24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS’2021) provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic digital, analog, and mixed-signal circuits and systems. The 24th symposium will be hosted by TU Wien in Vienna, Austria.

Announcements

Keynotes

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Committee

Organizing Committee

General Chair

Muhammad Shafique, NYU Abu Dhabi, UAE

General Vice Chairs

Andreas Steininger, TU Wien, Austria

Goran Stojanović, University of Novi Sad, Serbia

Program Chairs

Lukáš Sekanina, Brno University of Technology, Czech Republic

Miloš Krstić, IHP and University Potsdam, Germany

Publication Chair

Vojtěch Mrázek, Brno University of Technology, Czech Republic

Topic Chairs

Adrijan Barić, University of Zagreb, Croatia

Matthias Függer, CNRS & LSV, ENS Paris-Saclay & Inria, France

Jie Han, University of Alberta, Canada

Mottaqiallah Taouil, TU Delft, Netherlands

Finance Chair

Jürgen Maier, TU Wien, Austria

Registration Chair

Traude Sommer, TU Wien, Austria

Local Arrangements Chairs

Florian Huemer, TU Wien, Austria

Florian Kriebel, TU Wien, Austria

Program Committee

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Call for Papers

DDECS’2021 provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic digital, analog, and mixed-signal circuits and systems. The topics include the following but are not limited to:

  • Emerging Technologies
  • Wireless Communication Systems
  • Embedded Systems
  • Dependable Systems
  • Embedded Hardware for AI
  • Approximate Computing
  • Formal Methods in System Design
  • Hardware/Software Co-Design
  • IP-Based Design
  • ASIC/FPGA Design
  • Internet-of-Things Design and Test
  • SoC and NoC Design and Test
  • Digital Circuits Design and Test
  • RF, Analog, and Mixed-Signal Circuits Design and Test
  • Memory Design and Test
  • MEMS Design and Test

  • On-Line Testing
  • Built-in Self-Test and Self-Repair
  • Design for Testability and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design and Test in Nano-Technologies
  • ATE Hardware and Software
  • Physical Failure Analysis
  • Debug and Diagnosis
  • Hardware Security and Trust
  • Flexible and Printed Electronics
  • Automotive Electronics
  • Medical Electronics
  • AI in Design and Test of Circuits
  • Stretchable and Textile Electronics
  • Sensors and Transducers
  • Integrated Passive Components
  • Microfluidic Electronic Devices

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Author Information

Papers in English with a length of 6 pages maximum in the IEEE conference style (see below) are expected. Specialized student and industrial sessions, as well as embedded tutorials, will be organized. Accepted papers will be included in the Symposium Proceedings and submitted for publication in IEEE Xplore.

Submission Website

As soon as our submission page is ready, we will provide a link here.

Paper Template

All papers submitted to DDECS'2021 must use the template for conferences provided by the IEEE (link).

Important Dates

Abstract Registration

January 11, 2021  

Paper Submission

January 18, 2021  

Notification of Acceptance

March 21, 2021 

Publication Ready Version Submission

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Our Sponsors

Contact/Impressum

Institute of Computer Engineering - TU Wien
Embedded Computing Systems Group [link]
Treitlstasse 3, 2nd floor, A-1040 Wien (Austria) [Google Maps]
Phone: +43(1)58801-18203
Email: info@ddecs2021.wien